The in-depth SIM 3 seminar, taught by Bob McCarthy and Oscar Barrientos, provides participants with a thorough theoretical and operational understanding of source independent measurement and a solid grounding in application of SIM analysis in the design of complex audio systems. The seminar gives a brief review of SIM theory and system development, followed by a comprehensive discussion of field use procedures for the SIM 3 audio analyzer.
The seminar then extends the foundation of SIM measurement into sound system design. Participants also look at the complex interactions of loudspeakers in a variety of configurations and acoustical environments from the standpoints of phase, frequency and impulse responses.
(Jim Evans)
